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A technique based on artificial neural network (ANN) is proposed to extract the electromagnetic properties of reflection-asymmetric samples from reference-plane-invariant (RPI) scattering parameter measurements. It first determines reference plane transformation distances and then extracts the material properties. The number of neurons in the hidden layer of the ANN model was evaluated subject to accuracy and time constraints. We examined the conformity of the dataset of the ANN model and the required time for the training process by considering different numbers of neurons in the selected hid ...More
A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is co ...More