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A broadband, stable, and noniterative free-space method is proposed for dielectric constant ε′r determination of low-loss dielectric slabs from reflection-only measurements through simple calibration standards (reflect and air). It is applicable for dispersive samples and does not require thickness information. Simulations of nondisperive and dispersive samples are performed to validate our method. Dielectric constant measurements of polyethylene and polyoxymethylene samples (9–11 GHz) are carried out to examine the accuracy of our method.
A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is co ...Более
A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transform ...Более