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Базы данных : IEEE Xplore ✕Тематический рубрикатор : complex permittivity ✕
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Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

Mehmet ERTUĞRUL

A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is co ...Более

Статья 2022 Mühendislik Fakültesi IEEE Transactions on Instrumentation and Measurement71 86 Просмотры
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Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements

Mehmet ERTUĞRUL

A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transform ...Более

Статья 2021 Mühendislik Fakültesi IEEE Transactions on Geoscience and Remote Sensing60 ( Published online: 02 July 2021 ) 108 Просмотры
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