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Найденный: 2 Экземпляр 0.001 sn
Источник : IEEE Transactions on ... ✕Базы данных : IEEE Xplore ✕
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Artificial Neural Network Model for Evaluating Parameters of Reflection-Asymmetric Samples From Reference-Plane-Invariant Measurements

Mehmet ERTUĞRUL

A technique based on artificial neural network (ANN) is proposed to extract the electromagnetic properties of reflection-asymmetric samples from reference-plane-invariant (RPI) scattering parameter measurements. It first determines reference plane transformation distances and then extracts the material properties. The number of neurons in the hidden layer of the ANN model was evaluated subject to accuracy and time constraints. We examined the conformity of the dataset of the ANN model and the required time for the training process by considering different numbers of neurons in the selected hid ...Более

Статья 2023 Mühendislik Fakültesi IEEE Transactions on Instrumentation and Measurement72 62 Просмотры
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Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

Mehmet ERTUĞRUL

A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is co ...Более

Статья 2022 Mühendislik Fakültesi IEEE Transactions on Instrumentation and Measurement71 86 Просмотры
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